This page explains some of the special features in the BGMN
software.
Peak model
Base of the BGMN program is the modelling of the peak profiles (fig. 1) by a
deconvolution of wavelength distribution, instrumental profile and real
structure profile (crystallite size and micro strain broadening, see fig. 1).
For this purpose, the instrumental part of the profile can be simulated at
different angular points 2T in accordance with the geometrical conditions by
using a raytracing algorithm. Some
examples of resulting instrumental profiles
which can not be fitted by simple asymmetric functions like Pearson VII, are
presented here. In BGMN this complex profiles are described by a number of
Lorentzian functions (fig. 1). The parameters of these functions are
interpolated over the whole angular range. These profiles are convolutable
with wavelength distribution (experimentally determined, also described by
sum of 4 Lorentzian functions) and the sample profiles to be determined.
Fig. 1: Peak model in the BGMN program
Numerical algorithm
A special optimization algorithm permits the use of fixed upper and lower
limits for the most parameters so that physically meaningless values can be
prevented.
Modeling of preferred orientation
As preferred orientation models available, spherical harmonics of even order
which can also describe multiple preferred orientation depending on Laue
group with up to 66 parameters stand in addition to a simple ellipsoidal
model. The determined PO correction factor is reported for every reflection.
In that way it is possible to evaluate the success and meaning of the texture
correction.
Anisotropic peak broadening
Crystallite size and micro strain broadening can be refined by anisotropic
models in a simple manner. The program determines automatically the main axes
of the broadening ellipsoides according to the symmetry of the Laue group.
Automatic refinement
It is the most important program feature that there is no necessity for
controlling the refinement strategy by the user. All parameters to be
refined can be unlocked in the starting model, any storing and managing
of intermediate stages of refinement is needless. A solution will be always
found without intervention of the user. The error calculation for the
parameters and possible shift of a parameter to a limit defined in the
starting model do allow a judgement whether the starting model was sufficient
or not.
- J. Bergmann
Beiträge zur Auswertung und Versuchsplanung in der
Röntgenpulverdiffraktometrie
(contributions to evaluation and experimental design in the fields of X-ray
powder diffractometry)
PhD thesis (in german), Dresden University of Technology
1984
- G. Querner, J. Bergmann, W. Blau
A method for data reduction and optimal experimental design in XPD
proceedings of the 1st European Conference on Powder Diffraction (EPDIC 1)
Materials Science Forum 79-82 (1991) part 1 pp. 107-112
- J. Bergmann, R. Kleeberg, and T. Taut
A new structure refinement and quantitative phase analysis method basing on
predetermined true peak profiles
Z. Kristallogr., Supplement issue No. 8, Europ. Cryst. Meeting 15
(1994), Book of Abstracts p. 580
- T. Taut, J. Bergmann, G. Schreiber, A. Börner, E. Müller
Application of a New Rietveld Software for Quantitative Phase Analysis and
Lattice Parameter Determination of AlN-SiC-Ceramics
proceedings of the 4th European Conference on Powder Diffraction (EPDIC 4)
held in Chester, UK, 1995
Materials Science Forum 228-231 (1996) part 1 pp. 177-182
- J. Bergmann, D. Jehnichen, J. Tobisch, P. Friedel, M. Rillich, T. Taut
Powder diffraction investigations on molecular ring system
cyclo-tri(2,6-pyridyl formamidine)
proceedings of the 4th European Conference on Powder Diffraction (EPDIC 4)
held in Chester, UK, 1995
Materials Science Forum 228-231 (1996) part 2 pp. 869-872
- R. Kleeberg, J. Bergmann
Quantitative Röntgenphasenanalyse an schichtsilikathaltigen Gesteinen mit
der RIETVELD-Methode - Probleme, Erfolge, Grenzen.
Berichte der Deutschen Ton- und Tonmineralgruppe e.V. 4 (1997)
pp. 127-137
- D. Jehnichen, P. Friedel, J. Bergmann, T. Taut, and D. Pospiech
W.A.X.S. and force field RIETVELD modelling of meta-linked
fully aromatic copolyesters: 1. poly(p-phenylene isophtalate).
Polymer 39 (1998) pp. 1095-1102
- J. Bergmann, R. Kleeberg, and T. Taut
Quantitative Phase Analysis Using a New Rietveld Algorithm -
Assisted by Improved Stability and Convergence Behavior
Poster at the 45th annual X-Ray conference in Denver 1996
Advances in X-Ray Analysis, 40 (1998), 425 (published on CD-ROM)
- J. Bergmann and R. Kleeberg
Rietveld analysis of disordered layer silicates
Oral presentation at EPDIC 5
proceedings of the 5th European Conference on Powder Diffraction (EPDIC 5)
held in Parma, Italy, May 24-28, 1997
Materials Science Forum, 278-281 (1998) part 1 pp. 300-305
- P. Friedel, D. Jehnichen, J. Bergmann, T. Taut, and A. Haase
Application of Rietveld Refinement combined with Force Field Energy
Minimization to Structure Investigations of
Cyclo-tris-(2,6-pyridyl formamidine)
Oral presentation at the 41th annual X-Ray conference in Denver 1997
Advances in X-Ray Analysis, 41 (1999), pp. 593-600 (published on CD-ROM)
- R. Kleeberg, J. Bergmann
Quantifizierung von fehlgeordneten Schichtsilikaten mit der Rietveld-Methode
Berichte der Deutschen Ton- und Tonmineralgruppe e.V. 5 (1997)
pp. 35-44
- T. Taut, R. Kleeberg, J. Bergmann
The new Seifert Rietveld Program and its Application to Quantitative
Phase Analysis
Proceedings of the XVII Conference on Applied Crystallography,
Wisla, Poland, Aug 31 - Sep 4 1997
Editors: Henryk Morawiec & Danuta Stroz
World Scientific Singapore, New Yersey, London, Hong Kong 1998, 87-92
- P. Friedel, J. Tobisch, D. Jehnichen, J. Bergmann, T. Taut, M. Rillich,
C. Kunert, F. Böhme
Structure investigations of molecular crystals containing the ring system
cyclo-tris(2,6-pyridyl formamidine) by means of XPD and force field
constrained Rietveld refinement
J. Appl. Cryst. 31 (1998), p. 874
- T. Taut, R. Kleeberg und J. Bergmann
Vollautomatische Rietveld-Phasenanalyse mit dem Programm BGMN
Poster, 6. Jahrestagung der Deutschen Gesellschaft für Kristallographie
Z. Kristallog., Suppl. Issue No. 15 (1998) p. 153
- A. Herold, R. Kleeberg, J. Bergmann
Vollautomatische Rietveld-Phasenanalyse mit dem Programm BGMN
3. Symposium Technische und Angewandte Mineralogie 14.-16. Juni 1998
Halle (Saale)
Institut für Geologische Wissenschaften und Geiseltalmuseum,
Martin-Luther-Universität Halle/Wittenberg
- Jörg Bergmann, Peter Friedel & Reinhard Kleeberg
BGMN - a new fundamental parameters based Rietveld program for laboratory
X-ray sources, it's use in quantitative analysis and structure
investigations
CPD Newsletter No. 20, Summer 1998, pp. 5-8
Commission of Powder Diffraction, International Union of Crystallography
- T. Taut, R. Kleeberg, J. Bergmann
The new Seifert Rietveld
program BGMN and its application to quantitative phase analysis
Materials Science (Bulletin of the Czech and Slovak Crystallographic
Association) 5 (1998) pp. 55-64
- R. Kleeberg, J. Bergmann
Quantitative Röntgenphasenanalyse mit den Rietveldprogrammen BGMN
und AUTOQUANT in der täglichen Laborpraxis
Berichte der Deutschen Ton- und Tonmineralgruppe e.V. 6
(1998) pp. 237-250
- J. Bergmann, P. Friedel, R. Kleeberg
Handling of unusual instrumental profiles by the BGMN Rietveld program
Proceedings of the 6-th European Conference on Powder Diffraction (EPDIC6)
held in Budapest, Hungary, August 22-25, 1998.
Materials Science Forum 321-324 (1999), pp. 192-197
- P. Friedel, J. Bergmann
Molecular Modelling Features in XPD Rietveld Refinement of Organic
Structures
Proceedings of the 6-th European Conference on Powder Diffraction (EPDIC 6)
held in Budapest, Hungary, August 22-25, 1998.
Materials Science Forum 321-324 (1999) pp. 34-39
- J. Bergmann, R. Kleeberg
Standardfreie Size/Strain-Bestimmung mit dem Rietveld-Programm BGMN
Poster, 7. Jahrestagung der Deutschen Gesellschaft für Kristallographie
Z. Kristallogr., Suppl. Issue No. 16 (1999) p. 133
- J. Bergmann, R. Kleeberg
EFLECH/INDEX - a program pair for peak search/fit and indexing
CPD Newsletter No. 21, May 1999, p. 5
Commission of Powder Diffraction, International Union of Crystallography
- T. Monecke, R. Kleeberg, P. Herzig, J. Bergmann, B. Gemmell
Applications of quantitative X-ray diffraction analysis by the Rietveld
method
Proceedings of the fifth biennal SGA meeting and the tenth quadrennial IAGOD
symposium, London, UK, Aug 22-25 1999
published in: Mineral Deposits: Processes to Processing
edited by C.J. Stanley et al.
A.A. Balkema, Rotterdam & Brookfield 1999
- P. Friedel, J. Bergmann, T. Taut, J. Tobisch, D. Pospiech, D. Jehnichen
Wide angle X-ray diffraction and force field constrained Rietveld modelling
of m-linked fully aromatic copolyesters. 2. Poly(p-phenylene
Terephthalate-co-p-phenylene isophthalate)
Polymer 41 (2000) pp. 3791-3795
- J. Bergmann, R. Kleeberg
Fundamental parameters versus learnt profiles im Rietveld-Programm BGMN
Poster, 8. Jahrestagung der Deutschen Gesellschaft für Kristallographie
Z. Kristallog., Suppl. Issue No. 17 (2000) p. 96
- P. Friedel, D. Pospiech, D. Jehnichen, J. Bergmann, C.K. Ober
Polyesters with semifluorinated side chains: a proposal for the solid
state structure
J. Polym. Sci. Part B: Polym. Phys. 38 (2000) pp. 1617-1625
- J. Bergmann, R. Kleeberg, A. Haase, B. Breidenstein
Advanced Fundamental Parameters Model for Improved Profile Analysis
Proceedings of the 5th European Conference on Residual Stresses,
Delft-Noordwijkerhout, The Netherlands, Sep 29-30 1999.
Materials Science Forum 347-349 (2000) pp. 303-308
- J. Bergmann, R. Kleeberg
Improved Size/Strain Accuracy/Detection limits by Advanced Fundamentals
Method - A contribution to Line Profile Analysis and Rietveld Method:
Crossing Paths?
CPD Newsletter No. 23, July 2000, p. 5
Commission of Powder Diffraction, International Union of Crystallography
- J. Bergmann, T. Monecke, R. Kleeberg
Alternative algorithm for the correction of preferred orientation in
Rietveld analysis
J. Appl. Cryst. 34 (2001) pp. 16-19
- J. Bergmann, R. Kleeberg
Improving the Accuracy of Size/Micro Strain Estimation by
First Principles Monte Carlo Raytracing Fundamental Parameter Profiles
unpublished
- B. Peplinski, R. Kleeberg, J. Bergmann, J. Wenzel
Quantitative Phase Analysis Using the Rietveld Method - Estimates of
Possible Problems Based on Two Interlaboratory Comparisons
Materials Sience Forum 443-444 (2004) pp. 45-50
- K. Ufer, G. Roth, R. Kleeberg, H. Stanjek, R. Dohrmann, J. Bergmann
Description of X-ray powder pattern of turbostratically disordered layer
structures with a Rietveld compatible approach
Z. Kristallogr. 219 (2004) pp. 519-527